Перегляд за автором "Astakhov, O."

Сортувати за: Порядок: Результатів:

  • Astakhov, O.; Finger, F.; Carius, R.; Lambertz, A.; Neklyudov, I.; Petrusenko, Yu.; Borysenko, V.; Barankov, D. (Вопросы атомной науки и техники, 2007)
    Amorphous and microcrystalline silicon are well known materials for thin film large area electronics. The defects in the material are an important issue for the device quality and the manufacturing process optimization. ...
  • Petrusenko, Y.; Bakai, A.; Neklyudov, I.; Borysenko, V.; Barankov, D.; Astakhov, O.; Macht, M.P. (Вопросы атомной науки и техники, 2008)
    Accumulation and recovery kinetics of radiation damages in Zr₄₆.₈Ti₈.₂Cu₇.₅Ni₁₀Be₂₇.₅ and Zr₅₂.₅Ti₅Cu₁₇.₉Ni₁₄.₆Al₁₀ metallic glasses was investigated by means of low temperature electron irradiation and electrical ...